Scrub Contact
Product Outline
The bias shape of the probe tip can make scrubbing motion on the pad surface during contact.
The scrubbing probe motion is possible to maintain stable contact resistance value and break the oxide layer on the pad surface. It is ideal probe option for oxide layer countermeasures in the final test process for QFN, QFP and BGA which have tin plating Pad or Ball package.
The scrubbing probe motion is possible to maintain stable contact resistance value and break the oxide layer on the pad surface. It is ideal probe option for oxide layer countermeasures in the final test process for QFN, QFP and BGA which have tin plating Pad or Ball package.
Features
- Scrubbing the oxide film on the pad to achieve stable contact.
- It can be used for array pad or ball.
- This is spring probe technology. Therefore, it can be direct replaced from existing probe.
- High hardness Pd alloy with excellent durability can be selected.
- Our patented products.
Scrubbing mark
Probe tip image