In order to maintain a Z0=50Ω signal transmission through the IC socket contact path from the PCB land to
the IC lead terminal, this IC socket is designed with a complete Z0=50Ω coaxial probe contact structure, which
achieves more than 80GHz frequency bandwidth at -1.0dB insertion loss. It is most suitable for LSI evaluation,
inspection and testing.
This Coaxial IC socket is available for 1.0mm, 0.8mm and 0.5mm pitch contact matrixes.
This coaxial probe contact structure maintains impedance of 50 ohm from the PCB land to the IC PAD or ball
through the contact probe plunger and barrel. The structure of the complete coaxial probe dramatically
improves insertion loss, return loss and crosstalk.
This is a coaxial IC socket that uses double-sided contacts with solderless mounting. It has achieved
50ohm impednce control through its air dielectric structure; it can handle a maximum single lane rate of 56Gbps.
It is suitable for testing optical transceiver for 100Gbit/s(25Gx4), including PAM4 (Pulse Amplitude Modulation).
We can design sockets with heat blocks on the top or bottom of the device for heat disspation.
This is a solderless compression mount socket with high signal integrity. It has high durability (50K cycles),
high vibration resistance, and operating temperature between -40~150degreeC.; It can be connected to RF and
phased array modules, as well as 5G Massive-MIMO. Solderless compression mounting provides
superior integrity over 80GHz, long term repeatability and clean signal integrity with no distortion.
High Prequency 80GHz Test Socket
RF test socket detail information
English:Complete Z=50ohm Spring Probe IC socket bits2008
Detail information of coaxial structure IC test socket for High-frequency testing
High Density Coaxial B to B Connector for 5G Net Radio And Phased Array Rader